Measurement of sample reflectance

ABSTRACT

An accessory for a spectrometer for carrying out measurements of specular reflectance of a sample. The accessory is designed so that all components can be located in a housing and the sample can be located horizontally on a top-plate of the housing with the components disposed below the plane of that plate.

CROSS-REFERENCE TO RELATED APPLICATIONS

This patent application is a continuation of currently pending U.S.patent application Ser. No. 11/040,535, filed Jan. 21, 2005, whichclaimed priority from European application No. 04250265.8 filed Jan. 20,2004. All prior applications are hereby incorporated by referenceherein.

FIELD OF THE INVENTION

This invention relates to spectrometry and in particular relates to anassembly of components which can be used with a spectrometer in order tomeasure specular reflectance of a sample.

BACKGROUND OF THE INVENTION

Spectrometers are used to analyse samples to identify their properties.A spectrometer usually includes a source of radiation which is used toirradiate a sample and a receiver for receiving radiation eitherreflected from or transmitted by the sample. The receiver signal isanalysed to produce a spectrum which then provides information relatingto the sample.

There is a need in spectrometry to make accurate measurements ofspecular reflectance of a sample over a substantial range of angles andover a wide range of wavelengths, which typically can extend from theultraviolet (UV) through to the near infrared (NIR). There is an absenceof suitable reflectance standards which means that the reflectance ofsamples has to be measured directly without reference to a standardreflector. Currently there is a lack of suitable equipment available ata reasonable price that can measure reflectance over a significant rangeof angles and is sufficiently small and compact to be incorporated intomodern spectrometers.

Reflectance measurements are usually made using accessories which can beremovably coupled to a spectrometer. One known accessory design operateson the basic principle of providing two alternative paths for the lightbeam in the instrument sample compartment. One path is a sample path inwhich the beam reflects off the sample and is returned to thespectrometer detector. The other path is a background path in which thebeam is directed to the detector and does not reflect off the sample.The ratio of the detected signals is a measure of the samplereflectivity, but its accuracy is dependent upon whether there aredifferences in the beam transmission energy on the two paths ignoringthe effect of the sample itself. Since optical components do not reflector transmit perfectly, great care is needed to match the performance ofthe components in the two configurations and the optical path isarranged so that switch-over between paths can be made by reversing twomirrors so that in each configuration the beam is reflected at anidentical angle albeit reversed because of the presence or absence ofthe reflecting sample.

Also known accessories usually make use of the detector of theinstrument with which they are used and this can lead to difficulties inproviding an arrangement of optical components which will permitreflectance measurements over a wide range of angle of incidence of thebeam on the sample.

Another known problem is that of beam and/or detector inhomogeneity. Ifboth are non-uniform the output of the detector changes when the mirrorangles are reversed and some form of beam homogenisation is required.

The present invention is concerned with an assembly of components whichcan be provided as a spectrometer accessory and which is designed toalleviate the problems referred to.

According to one aspect of the present invention there is provided anassembly of components for use with a spectrometer to enable reflectancemeasurements to be made on a sample, said assembly comprising a samplelocation, optical elements for directing analysing radiation to saidsample location and a detector for receiving radiation reflected fromthe sample, at least one of the optical elements including a mirrorwhich is rotatable and translatable to enable radiation to be incidenton the sample over a range of angles. The sample location may bearranged so that in use the sample is generally horizontal to facilitatesample placement. The optical elements may include a path lengthcompensator. The path length compensator may comprise a mirror which canmove linearly and that mirror may comprise a roof mirror.

The detector may be mounted so as to be pivotable relative to thesample. The detector may also be mounted so that it can move linearlyrelative to the sample. The detector may form part of the detectorsub-assembly which includes two detector elements responsive todifferent wavelengths of radiation. One of the detector elements mayhave associated therewith an optical scrambler for scrambling theradiation prior to it being incident on the detector element. Thescrambler may be a light pipe.

The sample location may be fixed.

The optical elements may be located in a housing and the assembly cantake the form of an accessory for a spectrometer. The sample locationmay be located on the upper surface of the housing. The housing may havean aperture in its upper wall through which the radiation can pass tothe sample location.

Another aspect of the invention provides an accessory for use with aspectrometer to enable reflectance measurements to be made on a sample,said accessory comprising a housing providing a sample location, opticalelements disposed in said housing for directing analysing radiation tosaid sample location and a detector for receiving radiation reflectedfrom the sample, wherein the sample location is provided on an uppersurface of the housing. The upper wall of the housing may include anaperture through which the radiation can pass to the sample location.The upper wall may include a shutter for opening and closing theaperture.

The accessory may be locatable in the spectrometer in a positionnormally occupied by the detector of the spectrometer when it isoperating without the accessory.

A further aspect of the invention provides an assembly of components foruse with a spectrometer to enable reflectance measurements to be made ona sample comprising a sample location, optical elements for directinganalysing radiation to said sample location and a detector for receivingradiation reflected from said sample, wherein an optical scrambler inthe form of a light pipe is associated with the detector, said radiationpassing through the light pipe prior to the detector in order tominimise the effect of inhomogeneities in the detector.

A further aspect of the invention provides an assembly of components foruse with a spectrometer to enable reflectance measurements to be made onthe sample, said assembly comprising a sample location, a firstreflector for receiving analysing radiation propagating generallyhorizontally and for reflecting the radiation at least partiallyupwardly to a second reflector, a third reflector for receivingradiation from the second reflector and for directing the radiationalong a generally horizontal path which is horizontally displacedrelative to that of the incoming radiation, a fourth reflector fordirecting the radiation towards the sample location and a detector forreceiving radiation reflected from the sample. The direction ofradiation propagating from the third reflector may be generally oppositeto that of the incoming radiation. The third reflector may be a roofmirror. The third reflector can be movable linearly so that it can actas a path length compensator.

The invention will be described now by way of example only, withparticular reference to the accompanying drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic view of a reflectance accessory in accordance withan embodiment of the present invention;

FIGS. 1( a) to 1(d) are schematic views illustrating the operation ofthe accessory of FIG. 1;

FIG. 2 is a perspective view from the front left of a reflectanceaccessory in accordance with an embodiment of the present invention;

FIG. 3 is a perspective view from the front left of the accessory ofFIG. 2 with the cover removed;

FIG. 4 is a perspective view similar to FIG. 3, but with the steeringmirror assembly removed;

FIG. 5 is a view from below of the pathlength compensator;

FIG. 6 is a perspective view from the front right of the detectorassembly;

FIG. 7 is a more detailed view of the detector assembly;

FIG. 8 is a partial view from the rear right of the reflectanceaccessory;

FIG. 9 is a view from the rear right showing the steering mirror anddetector assembly;

FIG. 10 is a view from the rear showing the detector assembly, and

FIG. 11 is a view from low front right showing a mechanism forcontrolling arcuate movement of the detector assembly;

FIG. 12 is a view partly from above showing the mechanism of FIG. 11;

FIGS. 13 to 16 are schematic views illustrating how the components ofthe accessory move in different measurement configurations.

DETAILED DESCRIPTION OF THE INVENTION

FIG. 1 of the drawings shows schematically an embodiment of an accessorywhich can be used to carry out reflectance measurements on a sample. Theaccessory comprises a first mirror (10) which acts as a fold mirror andthe angle of inclination of this mirror is adjustable. A second mirrorwhich is a relay toroid (11) is mounted diagonally upwardly from themirror (10) so that it can receive radiation reflected from the foldmirror (10). The inclination of the mirror (11) is also adjustable.Radiation reflected from the mirror (11) is directed horizontallytowards a path length compensator (12). The path length compensator (12)takes the form of a 90° roof mirror pair having mirror elements (14 and15). The mirror elements (14 and 15) are mounted so that the plane ofeach mirror lies substantially vertically whereby incoming radiationpropagating horizontally from the mirror (11) is reflected from themirror (15) along a horizontal path (16) towards the mirror (14) fromwhich it is reflected along a further horizontal path (18).

The beam (18) reflected from the mirror (14) is incident on a steeringmirror (20). The steering mirror (20) is mounted so that its angle ofinclination can be adjusted and also its linear position along the pathof the beam (18) can also be adjusted. As shown in FIG. 1 radiationstriking the steering mirror (20) is directed diagonally upwardlytowards a sample location (22). A collector toroid mirror (24) ismounted downwardly from the sample location (22) so that it can receiveradiation reflected from a sample at the sample location (22) andreflect it towards a detector assembly (26). The steering mirror (20)can be pivoted to a position in which it reflects the beam (18) towardsthe collector mirror (24) without being incident on the sample.

As will be appreciated from the description to follow the assembly ofcomponents shown in FIG. 1 are constructed as an accessory for aspectrometer. When mounted in the spectrometer the accessory can receivea beam of radiation (28) produced from the radiation source of thespectrometer. The incoming beam is rectangular in cross-section andpasses through an image of the spectrometer slit controlling the widthof the beam (30) and a common beam aperture image controlling the heightof the beam (31) before propagating to the fold mirror (10). Thearrangement is such that the slits and the common beam aperture areimaged on to a sample at about unity magnification. The beam is firstfolded diagonally upwardly by the mirror (10) towards the relay toroidmirror (11). The purpose of relay toroid (11) is to refocus the imageonto the sample. The relay toroid redirects the beam horizontallytowards mirrors (14 and 15). The pair of mirrors (14, 15) can be movedhorizontally parallel to the incoming beams to provide beam pathlengthcompensation. The roof mirror also shifts the beam laterally in ahorizontal plane. The beam (18) from the path length compensator becomesthe input beam for the steering mirror (20) which directs the beamtowards the sample location (22). The beam is reflected towards thecollector toroid and then to the detector assembly (26). The collectortoroid is provided to refocus the beam. Also the collector toroid ismounted so that the beam is reflected up to around 30° out of a verticalplane to allow suitable location of the detector assembly. Signalsproduced by a detector of the detector assembly (26) can then beprocessed to measure the reflectance.

In order to enable reflectance measurements to be made over a range ofangles, the steering mirror is adjustable both in position andinclination so that the angle of incidence of the beam propagating fromthe steering mirror to the sample location can be changed. As the angleof incidence changes the angle of reflection from the sample alsochanges and in order to allow for this it will be seen that the detectorassembly (26) is mounted so that it can be moved both pivotally andlinearly in order to receive radiation transmitted from the sample. Alsothe mirror (14 and 15) can be moved linearly in order to provide pathlength compensation which is required as a result of movement of theother elements.

FIGS. 1( a) to 1(d) illustrate schematically the optical principles ofthe accessory. FIG. 1( a) shows the beam (18) reflected by the steeringmirror (20) on to the sample at an angle of incidence of 45°. The beampropagates from the sample to detector. FIG. 1( b) shows theconfiguration for the background measurement. In this configuration thesteering mirror (20) has been pivoted to the complementary angle so thatthe beam is directed to the detector without being reflected from thesample. In this configuration the detector assembly is moved verticallydownwards and it can be shown that the vertical distance that it has tobe moved is twice the vertical separation of the sample plane and thebeam (18).

To a good approximation the same area of the steering mirror isilluminated at the same (complementary) angle in both configurations.Also the same region of the detector is illuminated and the pathlengthsare identical. The image on the detector is, however, inverted betweenthe two configurations which, given a typical non-uniform light beam,means that for accurate measurements either the detector has to be veryuniform or an optical scrambler is required.

FIGS. 1( c) and 1(d) illustrate schematically the sample configurationsat the opposite ends of the range of possible angles incidence. FIG. 1(c) shows an angle of incidence of 8° and FIG. 1( d) shows an angle ofincident of 70°. These views show the need for the steering mirror (20)to translate as well as rotate. The detector also needs to rotate on anarc centred on the sample spot and also to move vertically downwards forthe background measurement. The drawings also illustrate that thecomponents of the accessory require careful location to avoid beaminterruptions.

FIGS. 2 to 12 illustrate a specific embodiment of a spectrometeraccessory operating on the principles shown generally in FIG. 1. Thisaccessory has been designed for use with a PerkinElmer Lambda 950spectrometer and is locatable in the compartment normally occupied bythe detector of such an instrument. The accessory comprises a housing orcover (50) which has a top plate (51) which provides a sample location(52) at which a sample can be placed horizontally. The top plate canhave covering layer of soft plastic material such as Teflon or Mylar toavoid possible damage to the optical surface of the sample. At thesample location (52) there is an aperture in the top plate (51) whichcan be closed by a shutter which is slidable between an open and aclosed position. One side wall (54) of the housing (50) has an opening(55) through which the beam (28) shown in FIG. 1 can propagate. There isalso a second aperture (56) through which the reference beam of thespectrometer can propagate.

FIGS. 3 to 10 illustrate the components which are accommodated withinthe housing (50). The fold mirror is shown at (10) and is mounted on anadjustable bracket (58). The toroid mirror (11) is mounted diagonallyupwardly from the fold mirror (10) and is suspended from the undersideof the top plate on a second adjustable bracket spaced horizontally fromthe path length compensator (12). The mirrors (14 and 15) of the pathlength compensator are mounted upon a casting (60) (see FIG. 5) and thiscasting is linked to an assembly comprising a lead screw (61) which isdrivable by a motor (62) through gears (64) so that when the motor (62)is energised the lead screw (61) rotates and causes linear movement ofthe pair of mirrors (14 and 15) along a path guided by slides (65 and66). This linear movement is parallel to the path of the beam (18) shownin FIG. 1.

In FIG. 3 the steering mirror assembly is shown at (20) and the samplelocation is shown at (22). The collector mirror is shown at (24) and thedetector assembly at (26). The steering mirror assembly as shown inFIGS. 3 and 9 comprises a pivotally mounted mirror (70) with a driveassembly including a motor (76), a lead screw transmission (72), a wormdrive motor (71) (only shown in FIG. 9), a worm wheel sector (73), leadscrew (74) and a slide (75). The motor (76) seen at the centre of FIG. 3can be energised to rotate the lead screw (74) and cause lineartranslational movement of the mirror (70) guided by the slide (75). Theworm drive motor (71) (only shown in FIG. 9) can be used to rotate theplane of the mirror (70).

The detector assembly is shown in more detail in FIGS. 4, 6, 7, 8 and 9.The detector assembly includes a bracket (80) which is mounted so thatit is movable along an arc defined by a curved member (81) and a hub(120). This arc is centred in the lateral and vertical dimensions on thesample location (22). The curved member (81) is supported by an arm (82)which supports one end of a lead screw (83), which can be driven by amotor (84). When the motor (84) is energised the lead screw rotates andcauses the bracket (80) to move along an arcuate path corresponding tothe arc defined by the arcuate element (81) about the sample location aspivot point.

FIGS. 11 and 12 show the mechanism for controlling arcuate movement ofthe detector assembly. The mechanism includes the hub (120) mountedalongside the arm (82). The hub (120) has an arcuate groove (121) inwhich are located two pins (122, 123). The pins (122 and 123) aredisposed with their axes generally at right angles to each other. Thepin (123) is fixed to a detector sub-plate (124) and the pin (122) restsfreely on an end surface of the sub-plate. Two balls (124, 125) arecarried by the detector sub-plate (126) and are arranged so that theycan run along an arcuate track defined by the arcuate element (81).

In use the detector assembly is constrained to move in an arc by the twopins (122, 123) running in the groove (121) and by the two balls (124,125) running on the arcuate track. The plane of the arcuate motion isdefined by the two balls and the larger (123) of the two pins which isfixed to the sub-plate (126). These elements define a three pointmounting. The other pin (122) is free to float perpendicular to thisplane, but constrains the rotation to be about the centre of rotation ofthe arc of the groove (121).

Contact of the bearing surfaces is maintained by spring pressure fromextension springs (not shown) which join spring posts (128, 129) to thedetector sub-plate (126). The centre of rotation lies in the plane ofthe sample.

To permit samples of arbitrary size to be placed on the top plate (51)the accessory is designed so that no components extend above the planeof the top-plate (51) and this precludes the use of a conventional axlefor the arc rotation. To achieve the required design the cross-sectionof the hub (120) is machined to be slightly less than a semi-circle.

The bracket (80) supports a number of elements which form part of thedetector assembly. There are two detector elements, one of these being asilicon detector (88) and the other being a lead sulphide detector (89).The silicon detector (88) is mounted so that it can be moved into or outof the path of radiation reflected by the collector mirror (24). A motor(87) is provided and can be energised to cause the detector to be moved.When the detector (88) is in the path of the beam reflected by themirror (24) radiation does not reach the lead sulphide detector (89).

A lightpipe (90) is associated with the lead sulphide detector (89) andarranged so that when the silicon detector is not in an operativeposition radiation reflected by the collector (24) is directed to alightpipe input mirror (92) and then is reflected along a path extendingthrough the lightpipe (90) and onto the lead sulphide detector (89).

The reason for providing two detectors (88 and 89) is to enable theaccessory to operate at different wavelengths. The silicon diodedetector (88) is provided for relatively short wave detection. Suchdetectors have excellent uniformity and for reasons discussed earliercan be used without any optical scrambling. The lead sulphide detector(89) is provided for detection at longer wavelengths, but thesedetectors have a problem in that their response can be quite non-uniformover the surface area of the detector. This means that it is necessaryto use an optical scrambler in order to counteract the effects of suchnon-uniformities. In the present embodiment the light pipe (90) acts asan optical scrambler and it has been found to be particularly suitablein this application. Typically the dimensions of the pipe are a lengthof 50 mm and a diameter of 3 mm. The lightpipe comprises a glass rodwith smooth sides polished at both ends and selected to have goodtransmission over the full spectral range. A particularly suitable glassis Suprasil 300, which has excellent transmission to beyond 2500 nm. Inuse an image of the sample is formed by the concave lightpipe inputmirror (92) onto the input end of the lightpipe (90). Multiple internalreflections in the lightpipe then scramble the image to produce asubstantially uniform patch of light at the output end of the lightpipe.This light is then refocussed onto the lead sulphide detector (89) by alightpipe output mirror (93). It is important to ensure that the sampleimage underfills the lightpipe input to ensure that small movements ofthe image do not lead to radiation missing in the lightpipe. Thescrambling ensures that distribution of light emerging from thelightpipe remains substantially unchanged so that even if the detectoris inhomogeneous the output signal is unchanged either for small imagemovements or for image inversion.

The assembly of components mounted on bracket (80) is also movablelinearly relative to the sample position for reasons explained earlierand this is achieved by means of a motor (100). The motor (100) can beenergised to rotate a lead screw (101) and this causes the detectorassembly to move upwardly or downwardly, the movement being guided by aslide (102).

The accessory has an electronics unit (104) which can be coupled to theprocessing circuitry of the spectrometer and is used to provide signalsfor energising the motors in order to correctly position of the moveablecomponents for the particular reflectance measurement being carried out.

The relative positions of the components of the accessory for variousmeasurements is illustrated in FIGS. 13, 14, 15 and 16. FIG. 13illustrates the relative position of the components of the accessorywhen a reflectivity measurement is carried out on a sample mounted atthe sample location (22) and the beam is incident on the sample at anangle of 70 degrees. It should be noted that in FIGS. 13 to 16, the pathlength compensator (12) is shown rotated through 90 degrees to itsactual configuration in order to illustrate the path of the beam. FIG.14 shows the position of the components for carrying out what is knownas a baseline measurement corresponding to the 70 degree measurement. Inthis configuration the beam does not reflect from the sample. As will beappreciated by those skilled in the art it is necessary to carry out ameasurement under conditions in which the beams does not reflect fromthe sample and compare that with the results obtained when the beam doesreflect off the sample as shown in FIG. 11.

FIGS. 15 and 16 are views corresponding to those of FIGS. 13 and 14, butillustrate the situation where the components have been adjusted to aposition in which the radiation is incident on the sample at an angle of8 degrees.

8 Degrees and 70 degrees represent the end points of the range of anglesover which the accessory can be used to measure reflectance of a sample.It will be appreciated that by appropriate movement of the movablecomponents of the accessory a measurement of the reflectance of a samplecan be carried out at any angle in the range 8 degrees to 70 degrees.

As will be appreciated by those skilled in the art the spectrometerproduces a reference beam as well as a sample beam. The accessoryincludes reference beam mirrors (110, 111, and 112) and a reference beamdetector (114) (see FIG. 8), but a detailed description of theseelements is not given as it is not necessary for an understanding of thepresent invention.

A particularly significant feature of the design of accessory describedabove is that all the components of the accessory are disposed below thehorizontal surface of the top plate (51).

1. A spectrometer accessory locatable in a spectrometer so that the beamof analyzing radiation of the spectrometer is incident on the accessory,said accessory enabling reflectance measurements to be made on a sampleat each of a range of angles, said accessory comprising a housingdefining a sample location, optical elements located in said housing fordirecting analyzing radiation to said sample location and a detectorlocated in said housing for receiving a radiation reflected from thesample, at least one of the optical elements including a mirror which isrotatable and translatable so that it can be oriented to direct theradiation to be incident on the sample over the range of angles, andsaid detector being movably mounted, the arrangement being such thatwhen said mirror is moved a corresponding movement of the detectoroccurs to ensure that the radiation reflected from the sample remainsincident on the detector; wherein said accessory further comprises afirst guide coupled to said mirror for controlling at least one of therotational and translational movement and a second guide coupled to saiddetector for controlling movement of said detector.
 2. An accessoryaccording to claim 1, wherein the sample location is arranged such thatin use the sample is generally horizontal.
 3. An accessory according toclaim 1, wherein the optical elements include a path length compensatorfor compensating optical path length changes caused by movement of theleast one optical element and the detector.
 4. An accessory according toclaim 3, wherein the path length compensator comprises a second mirrorwhich can move linearly.
 5. An accessory according to claim 4, whereinthe second mirror comprises a roof mirror.
 6. An accessory according toclaim 1, wherein the detector is mounted so as to be pivotable relativeto the sample.
 7. An accessory according to claim 6, wherein thedetector is mounted so that it can move linearly relative to the sample.8. An accessory according to claim 1, wherein the detector forms part ofa detector sub-assembly which includes two detector elements responsiveto different wavelengths.
 9. An accessory according to claim 8, whereinat least one of the detector elements has an associated opticalscrambler for scrambling the radiation prior to it being incident on thedetector element.
 10. An accessory according to claim 9, wherein thescrambler is a light pipe.
 11. An accessory according to claim 1,wherein the sample location is fixed.
 12. An accessory according toclaim 1, wherein said optical elements and detector are adjustable inposition so that radiation can be directed to the detector without beingincident on a sample thereby enabling a background measurement to bemade.
 13. An accessory according to claim 1 wherein the sample locationis on an upper surface of the housing.
 14. An accessory according toclaim 13, wherein the housing has an aperture in the upper wall throughwhich radiation can pass to the sample location.
 15. An accessoryaccording to claim 1 wherein the detector has an associated opticalscrambler for scrambling the radiation prior to it being incident on thedetector.
 16. The accessory of claim 1, wherein said first guide is aslide for controlling translational movement of said mirror.
 17. Theaccessory of claim 1, wherein said first guide is an arcuate element forcontrolling rotational movement of said mirror.
 18. The accessory ofclaim 1, wherein said second guide is a slide for controlling atranslational movement of said detector.
 19. The accessory of claim 1,wherein said second guide is an arcuate element for controlling arotational movement of said detector.
 20. The accessory of claim 1,comprising a motor coupled to at least one of the mirror and thedetector for causing movement of at least one of the mirror and thedetector.
 21. An accessory for use with a spectrometer to enablereflectance measurements to be made on a sample at each of a range ofangles, said accessory comprising a housing providing a sample locationon an upper surface of the housing, and a plurality of mirrors disposedin said housing for directing analyzing radiation along a path to adetector, at least some of the mirrors being adjustable so that theradiation can be arranged to be incident on the sample at a number ofdifferent angles of incidence in its path to the detector, characterizedin that said detector is disposed in said housing, and said mirrors areadjustable to provide a configuration in which the radiation is directedto the detector without being incident on the sample; wherein saidaccessory further comprises at least one guide coupled to at least oneof said mirrors for controlling adjustment of said at least one mirror;and wherein one of the said mirrors is rotatable and translatable sothat it can be oriented to direct the radiation to be incident on asample over a range of angles.
 22. An accessory according to claim 21,wherein the upper wall of the housing includes an aperture through whichthe radiation can pass to the sample location.
 23. An accessoryaccording to claim 22, wherein the upper wall of the housing includes ashutter for opening and closing said aperture.
 24. An accessoryaccording to claim 21, wherein the accessory is locatable in thespectrometer in a position normally occupied by the detector of thespectrometer when it is operating without the accessory.
 25. Theaccessory of claim 21, wherein said at least one guide is a slide forcontrolling a translational movement of said at least one mirror. 26.The accessory of claim 21, wherein said at least one guide is an arcuateelement for controlling a rotational movement of said at least onemirror.
 27. The accessory of claim 21, comprising a motor coupled to theat least one mirror for causing movement of the at least one mirror. 28.An accessory for use with a spectrometer to enable reflectancemeasurements to be made on a sample at each of a range of angles, saidaccessory comprising a housing providing a sample location on an uppersurface of the housing, and a plurality of mirrors disposed in saidhousing for directing analyzing radiation along a path to a detector, atleast some of the mirrors being adjustable so that the radiation can bearranged to be incident on the sample at a number of different angles ofincidence in its path to the detector, characterized in that saiddetector is disposed in said housing, and said mirrors are adjustable toprovide a configuration in which the radiation is directed to thedetector without being incident on the sample; wherein said accessoryfurther comprises at least one guide coupled to at least one of saidmirrors for controlling adjustment of said at least one mirror; andwherein the detector is mounted so as to be pivotable relative to thehousing.
 29. An accessory according to claim 28, wherein the detector ismounted so that it can be moved linearly relative to the sample.
 30. Aspectrometer accessory locatable in a spectrometer so that the beam ofanalyzing radiation of the spectrometer is incident on the accessory,said accessory enabling reflectance measurements to be made on a sampleat each of a range of angles, said accessory comprising a housingdefining a sample location, optical elements located in said housing fordirecting analyzing radiation to said sample location and a detectorlocated in said housing for receiving a radiation reflected from thesample, at least one of the optical elements including a mirror which isrotatable and translatable so that it can be oriented to direct theradiation to be incident on the sample over the range of angles, andsaid detector being movably mounted, the arrangement being such thatwhen said mirror is moved a corresponding movement of the detectoroccurs to ensure that the radiation reflected from the sample remainsincident on the detector; wherein the accessory further comprises amotor coupled to at least one of the mirror and the detector for causingmovement of at least one of the mirror and the detector.
 31. Aspectrometer accessory locatable in a spectrometer so that the beam ofanalyzing radiation of the spectrometer is incident on the accessory,said accessory enabling reflectance measurements to be made on a sampleat each of a range of angles, said accessory comprising a housingdefining a sample location, optical elements located in said housing fordirecting analyzing radiation to said sample location and a detectorlocated in said housing for receiving a radiation reflected from thesample, at least one of the optical elements including a mirror which isrotatable and translatable so that it can be oriented to direct theradiation to be incident on the sample over the range of angles, andsaid detector being movably mounted, the arrangement being such thatwhen said mirror is moved a corresponding movement of the detectoroccurs to ensure that the radiation reflected from the sample remainsincident on the detector; wherein said accessory further comprises afirst guide coupled to said mirror for controlling at least one of therotational and translational movement and a second guide coupled to saiddetector for controlling movement of said detector, and wherein thefirst guide controls said at least one of the rotational andtranslational movement so that said at least one of the rotational andtranslational movement controlled by the guide only occurs in directionsparallel to the plane of incidence of the radiation incident on themirror.